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dc.contributor.authorBeyer, Terryen_US
dc.date.accessioned2004-10-04T14:43:58Z
dc.date.available2004-10-04T14:43:58Z
dc.date.issued1968-09-01en_US
dc.identifier.otherAIM-166en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/6169
dc.description.abstractIn this paper we study recognition of topological invariant properties of patterns by use of finite, rectangular 2-dimensional, interactive arrays of finite state automata (hereafter called modular arrays). The use of modular arrays as pattern recognition devices has been studied by Atrubin [1] and by Unger [2]. Our aim is to show that modular arrays can not only recognize a large variety of topological invariants, but can do so in times that are almost minimal for a certain class of machines. We begin by describing our model of the modular array as a pattern recognition connectivity. Next, we introduce a fundamental transformation of patterns and prove several interesting properties of the transformation. Finally, we apply the transformation to modular arrays to obtain fast methods of recognizing a wide variety of topological invariants.en_US
dc.format.extent7489364 bytes
dc.format.extent539367 bytes
dc.format.mimetypeapplication/postscript
dc.format.mimetypeapplication/pdf
dc.language.isoen_US
dc.relation.ispartofseriesAIM-166en_US
dc.titleRecognition of Topological Invariants by Modular Arraysen_US


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