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dc.contributor.advisorStanley B. Gershwin.en_US
dc.contributor.authorLiow, Yuh Han Johnen_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Mechanical Engineering.en_US
dc.date.accessioned2011-05-09T15:17:38Z
dc.date.available2011-05-09T15:17:38Z
dc.date.copyright2010en_US
dc.date.issued2010en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/62672
dc.descriptionThesis (M. Eng. in Manufacturing)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2010.en_US
dc.descriptionCataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (p. 57).en_US
dc.description.abstractThe manufacturing production of active pharmaceutical ingredients often involve a series of processing stages in which yield limits are prescribed to ensure that the target yield has been achieved for a batch and that the workers may proceed to the next batch of materials. Such yield limits is comprised of a maximum value for yields above 100% and a minimum value for yields of lower than 100%. These yield limits for each of the processing steps are conventionally prescribed based on accumulated experiences with production after an extended period of time. This paper is based on an internship project at a major pharmaceutical firm in Singapore, and it discusses the sources of yield losses and the reasons behind yield excursions which have not been well documented within the production facility. In doing so, the paper attempts to provide insights into the possible explanations for the current maximum and minimum yield limits application. Furthermore, using the yield limit values as applied for certain products, a preliminary framework is developed to provide a set of recommendations for the adjustment of conventional yield limit values to suit similar processing stages for the manufacturing of a novel drug product. This framework should prove to be useful in meeting the uncertainties inherent in the production of new products and in making initial recommendations for yield limits since there is usually limited experience from drug developments and clinical manufacture.en_US
dc.description.statementofresponsibilityby Yuh Han John, Liow.en_US
dc.format.extent57 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectMechanical Engineering.en_US
dc.titleFramework for the determination of yield limits In pharmaceutical operationsen_US
dc.typeThesisen_US
dc.description.degreeM.Eng.in Manufacturingen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineering
dc.identifier.oclc714254959en_US


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