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dc.contributor.advisorMark Bathe.en_US
dc.contributor.authorPerley, Elizabeth (Elizabeth Bacher)en_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2011-10-17T21:27:35Z
dc.date.available2011-10-17T21:27:35Z
dc.date.copyright2011en_US
dc.date.issued2011en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/66452
dc.descriptionThesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2011.en_US
dc.descriptionCataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (p. 70-71).en_US
dc.description.abstractBudding yeast Saccharomyces cerevisiae is a standard model system for analyzing cellular response as it is related to the cell cycle. The analysis of yeast cell cycle is typically done visually or by using flow cytometry. The first of these methods is slow, while the second offers a limited amount of information about the cell's state. This thesis develops methods for automatically analyzing yeast cell morphology and yeast cell cycle using high content screening with a high-capacity automated imaging system. The images obtained using this method can also provide information about fluorescently labelled proteins, unlike flow cytometry, which can only measure overall fluorescent intensity. The information about yeast cell cycle stage and protein amount and localization can then be connected in order to develop a model of yeast cellular response to DNA damage.en_US
dc.description.statementofresponsibilityby Elizabeth Perley.en_US
dc.format.extent71 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleBudding yeast cell cycle analysis and morphological characterization by automated image analysisen_US
dc.title.alternativeCellular response to DNA damage in budding yeasten_US
dc.title.alternativeCellular response to deoxyribonucleic acid damage in budding yeasten_US
dc.typeThesisen_US
dc.description.degreeM.Eng.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc755812032en_US


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