dc.contributor.advisor | Mark Bathe. | en_US |
dc.contributor.author | Perley, Elizabeth (Elizabeth Bacher) | en_US |
dc.contributor.other | Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. | en_US |
dc.date.accessioned | 2011-10-17T21:27:35Z | |
dc.date.available | 2011-10-17T21:27:35Z | |
dc.date.copyright | 2011 | en_US |
dc.date.issued | 2011 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/66452 | |
dc.description | Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2011. | en_US |
dc.description | Cataloged from PDF version of thesis. | en_US |
dc.description | Includes bibliographical references (p. 70-71). | en_US |
dc.description.abstract | Budding yeast Saccharomyces cerevisiae is a standard model system for analyzing cellular response as it is related to the cell cycle. The analysis of yeast cell cycle is typically done visually or by using flow cytometry. The first of these methods is slow, while the second offers a limited amount of information about the cell's state. This thesis develops methods for automatically analyzing yeast cell morphology and yeast cell cycle using high content screening with a high-capacity automated imaging system. The images obtained using this method can also provide information about fluorescently labelled proteins, unlike flow cytometry, which can only measure overall fluorescent intensity. The information about yeast cell cycle stage and protein amount and localization can then be connected in order to develop a model of yeast cellular response to DNA damage. | en_US |
dc.description.statementofresponsibility | by Elizabeth Perley. | en_US |
dc.format.extent | 71 p. | en_US |
dc.language.iso | eng | en_US |
dc.publisher | Massachusetts Institute of Technology | en_US |
dc.rights | M.I.T. theses are protected by
copyright. They may be viewed from this source for any purpose, but
reproduction or distribution in any format is prohibited without written
permission. See provided URL for inquiries about permission. | en_US |
dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | en_US |
dc.subject | Electrical Engineering and Computer Science. | en_US |
dc.title | Budding yeast cell cycle analysis and morphological characterization by automated image analysis | en_US |
dc.title.alternative | Cellular response to DNA damage in budding yeast | en_US |
dc.title.alternative | Cellular response to deoxyribonucleic acid damage in budding yeast | en_US |
dc.type | Thesis | en_US |
dc.description.degree | M.Eng. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
dc.identifier.oclc | 755812032 | en_US |