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dc.contributor.authorHerrmann, Felix
dc.contributor.authorde Hoop, Martijn V.
dc.contributor.otherMassachusetts Institute of Technology. Earth Resources Laboratoryen_US
dc.date.accessioned2011-12-21T19:07:17Z
dc.date.available2011-12-21T19:07:17Z
dc.date.issued2002
dc.identifier.urihttp://hdl.handle.net/1721.1/67849
dc.description.abstractA matching pursuit technique in conjunction with an imaging method is used to obtain quantitative information on geological records from seismic data. The technique is based on a greedy, non-linear search algorithm decomposing data into atoms. These atoms are drawn from a redundant dictionary of seismic waveforms. Fractional splines are used to define this dictionary, whose elements are not only designed to match the observed waveforms but also to span the appropriate family of geological patterns. Consequently, the atom’s parameterization provides localized scale, order and direction information that reveals the stratigraphy and the type of geological transitions. Besides a localized scaling characterization, the atomic decomposition allows for an accurate denoised reconstruction of data with only a small number of atoms. Application of this approach to angles gathers allows us to track geological singularities from seismic data. Our characterization bridges the gap between the analysis of the main features within geologic processes, i.e. the geologic patterns, and the interpretation of their associated seismic response. A case study of Valhall data is presented.en_US
dc.description.sponsorshipMassachusetts Institute of Technology. Earth Resources Laboratoryen_US
dc.publisherMassachusetts Institute of Technology. Earth Resources Laboratoryen_US
dc.relation.ispartofseriesEarth Resources Laboratory Industry Consortia Annual Report;2002-10
dc.titleMultifractional splines: from seismic singularities to geological transitionsen_US
dc.typeTechnical Reporten_US
dc.contributor.mitauthorde Hoop, Martijn V.
dc.contributor.mitauthorHerrmann, Felix
dspace.orderedauthorsHerrmann, Felix; de Hoop, Martijn V.en_US


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