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dc.contributor.authorWillis, Mark E.
dc.contributor.authorRao, Rama V. N.
dc.contributor.authorBurns, Daniel R.
dc.contributor.authorToksoz, M. Nafi
dc.contributor.authorVetri, Laura
dc.contributor.otherMassachusetts Institute of Technology. Earth Resources Laboratoryen_US
dc.date.accessioned2011-12-22T19:43:55Z
dc.date.available2011-12-22T19:43:55Z
dc.date.issued2005
dc.identifier.urihttp://hdl.handle.net/1721.1/67884
dc.description.abstractDiscrete, vertically aligned fracture systems impart one or more notches in the spectral ratios of stacked reflected seismic traces. This apparent attenuation is due to the azimuth dependant scattering introduced by the fractures. The most prominent notch is located at the frequency where the P wavelength is about twice the fracture spacing. The frequency location of the notches can be used to determine the fracture spacings. Azimuth stacks with an orientation parallel to the fractures tend not show these spectral notches – allowing for another way to detect the fracture orientation. An analysis of the vertical component of the 3D, ocean bottom cable seismic survey data from the Emilio field, offshore Italy, shows a prominent set of fractures with a spacing of about 30 to 40 meters with orientations that agree with previous studies.en_US
dc.description.sponsorshipEni S.p.A. (Firm)en_US
dc.description.sponsorshipUnited States. Dept. of Energy (Grant number DE-FC26-02NT15346)en_US
dc.description.sponsorshipMassachusetts Institute of Technology. Earth Resources Laboratoryen_US
dc.publisherMassachusetts Institute of Technology. Earth Resources Laboratoryen_US
dc.relation.ispartofseriesEarth Resources Laboratory Industry Consortia Annual Report;2005-10
dc.titleFracture Spacing and Orientation Estimation from Spectral Analyses of Azimuth Stacksen_US
dc.typeTechnical Reporten_US
dc.contributor.mitauthorWillis, Mark E.
dc.contributor.mitauthorRao, Rama V. N.
dc.contributor.mitauthorBurns, Daniel R.
dc.contributor.mitauthorToksoz, M. Nafi
dspace.orderedauthorsWillis, Mark E.; Rao, Rama V. N.; Burns, Daniel R.; Toksoz, M. Nafi; Vetri, Lauraen_US


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