Custom built atomic force microscope for nitrogen-vacancy diamond magnetometry
Author(s)
Chang, Kevin Kai
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Other Contributors
Massachusetts Institute of Technology. Dept. of Chemistry.
Advisor
Christian L. Degen.
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The nitrogen-vacancy (N-V) center in diamonds have the potential to be an ultra-sensitive magnetic field sensor that is capable of detecting single spins. Implementing this sensor for general and nontransparent samples is not trivial. For N-V centers to be a useful probe, a way of positioning the NV center with nanometer accuracy while simultaneously measuring its fluorescence is needed. Here, a method of using N-V centers as magnetometer probes by combining this sensor with Atomic Force Microscopy (AFM) is described. A custom AFM was built that allows optical monitoring of the cantilever tip and collection of fluorescence with a high-NA objective from the same side. The AFM has a large open bottom and top and thus provides dual optical access. The motion of the cantilever is measured by optical beam deflection so that a wide range of commercial cantilevers can be used. The AFM and the confocal microscope objective can be locked in position while a piezoelectric stage allows raster scanning of the substrate.
Description
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Chemistry, 2011. Cataloged from PDF version of thesis. Includes bibliographical references (p. 27).
Date issued
2011Department
Massachusetts Institute of Technology. Department of ChemistryPublisher
Massachusetts Institute of Technology
Keywords
Chemistry.