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dc.contributor.advisorJung-Hoon Chun.en_US
dc.contributor.authorJain, Pranaven_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Mechanical Engineering.en_US
dc.date.accessioned2012-02-29T18:21:01Z
dc.date.available2012-02-29T18:21:01Z
dc.date.copyright2011en_US
dc.date.issued2011en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/69489
dc.descriptionThesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2011.en_US
dc.descriptionCataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (p. 75-76).en_US
dc.description.abstractThis work investigates the root causes of the incidence of solder flux residue underneath electronic components in the manufacture of power modules. The existing deionized water-based centrifugal cleaning process was analyzed and hypotheses for root causes of the problem were proposed. The experimentation included cleaning tests using agitation and soak cycles. Parameters such as chemical agent, time and temperature were also tested for these tests. A novel method of residue incidence determination using visual inspection was proposed. Results suggest that the centrifugal process with water is incapable of providing enough agitation to effectively clean the residue. It was also found that product design and architectural causes greatly contribute to cleaning process effectiveness. It was concluded that effective printed circuit board cleaning requires high agitation and efficient product design.en_US
dc.description.statementofresponsibilityby Pranav Jain.en_US
dc.format.extent76 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectMechanical Engineering.en_US
dc.titleRoot cause analysis of solder flux residue incidence in the manufacture of electronic power modulesen_US
dc.typeThesisen_US
dc.description.degreeM.Eng.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineering
dc.identifier.oclc775602008en_US


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