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dc.contributor.authorTrenkle, Jonathan C.
dc.contributor.authorPackard, Corinne E.
dc.contributor.authorSchuh, Christopher A.
dc.date.accessioned2012-03-14T14:52:09Z
dc.date.available2012-03-14T14:52:09Z
dc.date.issued2010-07
dc.date.submitted2010-02
dc.identifier.issn0034-6748
dc.identifier.urihttp://hdl.handle.net/1721.1/69648
dc.description.abstractAn instrument capable of performing nanoindentation at temperatures up to 500 °C in inert atmospheres, including partial vacuum and gas near atmospheric pressures, is described. Technical issues associated with the technique (such as drift and noise) and the instrument (such as tip erosion and radiative heating of the transducer) are identified and addressed. Based on these considerations, preferred operation conditions are identified for testing on various materials. As a proof-of-concept demonstration, the hardness and elastic modulus of three materials are measured: fused silica (nonoxidizing), aluminum, and copper (both oxidizing). In all cases, the properties match reasonably well with published data acquired by more conventional test methods.en_US
dc.description.sponsorshipUnited States. Office of Naval Research (Contract No. N00014-08-1-0312)en_US
dc.description.sponsorshipMassachusetts Institute of Technology. Institute for Soldier Nanotechnologiesen_US
dc.language.isoen_US
dc.publisherAmerican Institute of Physicsen_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.3436633en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alike 3.0en_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/en_US
dc.sourceProf. Schuh via Angie Locknaren_US
dc.titleHot nanoindentation in inert environmentsen_US
dc.typeArticleen_US
dc.identifier.citationTrenkle, Jonathan C., Corinne E. Packard, and Christopher A. Schuh. “Hot Nanoindentation in Inert Environments.” Review of Scientific Instruments 81.7 (2010): 073901.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.approverSchuh, Christopher A.
dc.contributor.mitauthorTrenkle, Jonathan C.
dc.contributor.mitauthorPackard, Corinne E.
dc.contributor.mitauthorSchuh, Christopher A.
dc.relation.journalReview of Scientific Instrumentsen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsTrenkle, Jonathan C.; Packard, Corinne E.; Schuh, Christopher A.en
dc.identifier.orcidhttps://orcid.org/0000-0001-9856-2682
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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