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dc.contributor.authorChakrabarti, Ayan
dc.contributor.authorZickler, Todd
dc.contributor.authorFreeman, William T.
dc.date.accessioned2012-07-30T17:28:10Z
dc.date.available2012-07-30T17:28:10Z
dc.date.issued2010-08
dc.date.submitted2010-06
dc.identifier.isbn978-1-4244-6984-0
dc.identifier.issn1063-6919
dc.identifier.urihttp://hdl.handle.net/1721.1/71891
dc.description.abstractBlur is caused by a pixel receiving light from multiple scene points, and in many cases, such as object motion, the induced blur varies spatially across the image plane. However, the seemingly straight-forward task of estimating spatially-varying blur from a single image has proved hard to accomplish reliably. This work considers such blur and makes two contributions: a local blur cue that measures the likelihood of a small neighborhood being blurred by a candidate blur kernel; and an algorithm that, given an image, simultaneously selects a motion blur kernel and segments the region that it affects. The methods are shown to perform well on a diversity of images.en_US
dc.description.sponsorshipUnited States. National Geospatial-Intelligence Agency (NEGI-1582-04-0004)en_US
dc.description.sponsorshipUnited States. Army Research Office. Multidisciplinary University Research Initiative (Grant Number N00014-06-1-0734)en_US
dc.description.sponsorshipGoogle (Firm)en_US
dc.description.sponsorshipMicrosoft Corporationen_US
dc.description.sponsorshipAdobe Systemsen_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/ 10.1109/CVPR.2010.5539954en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleAnalyzing spatially-varying bluren_US
dc.typeArticleen_US
dc.identifier.citationChakrabarti, Ayan, Todd Zickler, and William T. Freeman. “Analyzing Spatially-varying Blur.” IEEE, 2010. 2512–2519. © Copyright 2010 IEEEen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.approverFreeman, William T.
dc.contributor.mitauthorFreeman, William T.
dc.relation.journal2010 IEEE Conference on Computer Vision and Pattern Recognitionen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsChakrabarti, Ayan; Zickler, Todd; Freeman, William T.en
dc.identifier.orcidhttps://orcid.org/0000-0002-2231-7995
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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