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dc.contributor.authorGogineni, Usha
dc.contributor.authordel Alamo, Jesus A.
dc.contributor.authorValdes-Garcia, Alberto
dc.date.accessioned2012-08-02T18:45:26Z
dc.date.available2012-08-02T18:45:26Z
dc.date.issued2011-07
dc.date.submitted2011-06
dc.identifier.isbn978-1-4244-8291-7
dc.identifier.isbn978-1-4244-8293-1
dc.identifier.issn1529-2517
dc.identifier.urihttp://hdl.handle.net/1721.1/71960
dc.description.abstractThis paper presents a first order model for RF power of deeply scaled CMOS. The model highlights the role of device on-resistance in determining the maximum RF power. We show excellent agreement between the model and the measured data on 45 nm CMOS devices across a wide range of device widths, under both maximum output power and maximum PAE conditions. The model allows circuit designers to quickly estimate the power and efficiency of a device layout without need for complicated compact models or simulations.en_US
dc.description.sponsorshipSemiconductor Research Corporation. (Grant Number 2007-HJ-1661)en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/RFIC.2011.5940647en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alike 3.0en_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/en_US
dc.sourceMIT web domainen_US
dc.titleAnalytical model for RF power performance of deeply scaled CMOS devicesen_US
dc.typeArticleen_US
dc.identifier.citationGogineni, Usha, Jesus del Alamo, and Alberto Valdes-Garcia. “Analytical Model for RF Power Performance of Deeply Scaled CMOS Devices.” IEEE Radio Frequency Integrated Circuits Symposium, 2011. 2011 1–4.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.approverdel Alamo, Jesus A.
dc.contributor.mitauthorGogineni, Usha
dc.contributor.mitauthordel Alamo, Jesus A.
dc.relation.journal2011 IEEE Radio Frequency Integrated Circuits Symposiumen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsGogineni, Usha; del Alamo, Jesus; Valdes-Garcia, Albertoen
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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