Abstract:
Since the first demonstration of a comparator-based switched-capacitor circuit, analog-to-digital (A/D) converters based on virtual ground detection have made steady and significant progress. Comparators have been replaced by zero-crossing detectors, leading to the development of zero-crossing based circuits for faster speed and lower power. All facets of performance including the sampling rate, effective number of bits, noise floor, and figure-of-merit have improved substantially. This paper focuses on recent implementations of zero-crossing based A/D converters and discusses the technical issues unique to these A/D converters as well as solutions that have been developed to improve their performance and practicality. A series of prototype designs whose performance ranges from 8 bit, 200 MS/s to 12 bit, 50 MS/s are described. The ultimate low power potentials of these A/D converters are compared with various different types of complementary metal-oxide-semiconductor A/D converters from a fundamental thermal noise standpoint.
