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dc.contributor.authorCoram, Geoffrey J.
dc.contributor.authorAnderson, Brian D.O.
dc.contributor.authorWyatt, John L.
dc.date.accessioned2005-01-13T20:05:38Z
dc.date.available2005-01-13T20:05:38Z
dc.date.issued2000-02-18
dc.identifier.urihttp://hdl.handle.net/1721.1/7513
dc.description.abstractThis paper considers a connection between the deterministic and noisy behavior of nonlinear networks. Specifically, a particular bridge circuit is examined which has two possibly nonlinear energy storage elements. By proper choice of the constitutive relations for the network elements, the deterministic terminal behavior reduces to that of a single linear resistor. This reduction of the deterministic terminal behavior, in which a natural frequency of a linear circuit does not appear in the driving-point impedance, has been shown in classical circuit theory books (e.g. [1, 2]). The paper shows that, in addition to the reduction of the deterministic behavior, the thermal noise at the terminals of the network, arising from the usual Nyquist-Johnson noise model associated with each resistor in the network, is also exactly that of a single linear resistor. While this result for the linear time-invariant (LTI) case is a direct consequence of a well-known result for RLC circuits, the nonlinear result is novel. We show that the terminal noise current is precisely that predicted by the Nyquist-Johnson model for R if the driving voltage is zero or constant, but not if the driving voltage is time-dependent or the inductor and capacitor are time-varyingen
dc.description.sponsorshipSupported by the National Science Foundation under Grant 94-23221, by DARPA/ARO under Contract DAAH04-94-G-0342, and by the NEC Research Institute, Princeton, New Jersey.en
dc.format.extent549484 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoen
dc.relation.ispartofseriesTechnical Report (Massachusetts Institute of Technology, Research Laboratory of Electronics);634
dc.titleThermal Noise Behavior of the Bridge Circuiten
dc.typeTechnical Reporten


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