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dc.contributor.authorZhao, Xiaomin
dc.contributor.authorToksoz, M. Nafi
dc.contributor.otherMassachusetts Institute of Technology. Earth Resources Laboratoryen_US
dc.date.accessioned2012-12-03T20:47:53Z
dc.date.available2012-12-03T20:47:53Z
dc.date.issued1991
dc.identifier.urihttp://hdl.handle.net/1721.1/75177
dc.description.abstractAn inversion procedure has been formulated to estimate the surface roughness of a joint (fracture) from the measured pressure-closure data. A gamma distribution for the local minima (or maxima) on a topography profile was used to account for the skewness in the measured distribution of the asperities. By using the distribution, the average height [bar over z] and the standard deviation a of the profile can also be characterized. An inversion procedure was formulated based on the modification of the theory proposed by Brown and Scholz (1985) and has been successfully tested with synthetic data. The inversion finds average height [bar over z][subscript 1], standard deviation σ, and average aperture. These three parameters characterize the surface roughness and aperture of a fracture and are the topography parameters governing permeability, electric conductivity and other transport properties of the fracture. Pressure-closure data from laboratory measurement of a rough and a smooth joint were also inverted to find the joint properties. The results agree with the profile measurement quite well. The variations of transport properties of a fracture with pressure are also studied.en_US
dc.description.sponsorshipMassachusetts Institute of Technology. Full Waveform Acoustic Logging Consortiumen_US
dc.description.sponsorshipUnited States. Dept. of Energy (Grant DE-FG02-86ER13636)en_US
dc.publisherMassachusetts Institute of Technology. Earth Resources Laboratoryen_US
dc.relation.ispartofseriesEarth Resources Laboratory Industry Consortia Annual Report;1991-06
dc.titleCharacterizing Surface Roughness From Pressure-Joint Closure Measurements Using Inversion Procedureen_US
dc.typeTechnical Reporten_US
dc.contributor.mitauthorZhao, Xiaomin
dc.contributor.mitauthorToksoz, M. Nafi
dspace.orderedauthorsZhao, Xiaomin; Toksoz, M. Nafien_US


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