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Minimizing the risk qualification test wafers have on the manufacturing readings of a new microprocessor fabrication site through data processes
(Massachusetts Institute of Technology, 2001)
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Author
Howe, Jonathan E. (Jonathan Emerson), 1973- (1)
Department
Department of Mechanical Engineering (1)
Sloan School of Management (1)
DegreeS.M. (1)SubjectMechanical Engineering. (1)Sloan School of Management. (1)... View MoreDate Issued
2001 (1)
Has File(s)Yes (1)