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The dielectric properties of non-stoichiometric polyelectrolyte complexes. 

Opp, David Austin (Massachusetts Institute of Technology, 1965)
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Modeling the effect of boron on microdefect formation 

Susanto, Hendi, 1973- (Massachusetts Institute of Technology, 1999)
As microelectronic devices demand larger diameter wafers and reduced microdefect concentration and size, one of the most crucial issues in the semiconductor industry becomes the understanding of defect formation in silicon ...

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AuthorOpp, David Austin (1)Susanto, Hendi, 1973- (1)Subject
Chemical Engineering (2)
... View MoreDate Issued1990 - 1999 (1)1965 - 1969 (1)Has File(s)Yes (2)

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