Now showing items 1-2 of 2
The dielectric properties of non-stoichiometric polyelectrolyte complexes.
(Massachusetts Institute of Technology, 1965)
Modeling the effect of boron on microdefect formation
(Massachusetts Institute of Technology, 1999)
As microelectronic devices demand larger diameter wafers and reduced microdefect concentration and size, one of the most crucial issues in the semiconductor industry becomes the understanding of defect formation in silicon ...