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dc.contributor.advisorGang Chen.en_US
dc.contributor.authorHsu, Wei-Chunen_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Mechanical Engineering.en_US
dc.date.accessioned2013-03-28T18:11:56Z
dc.date.available2013-03-28T18:11:56Z
dc.date.copyright2012en_US
dc.date.issued2012en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/78182
dc.descriptionThesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2012.en_US
dc.descriptionCataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (p. 85-88).en_US
dc.description.abstractOptical properties of micro/nano materials are important for many applications in biology, optoelectronics, and energy. In this thesis, a method is described to directly measure the quantitative absorptance spectra of micro/nano-sized structures using Fourier Transform Spectroscopy (FTS). The measurement technique combines optomechanical cantilever probes with a modulated broadband light source from an interferometer for spectroscopic measurements of objects. Previous studies have demonstrated the use of bilayer (or multi-layer) cantilevers as highly sensitive heat flux probes with the capability of resolving power as small as ~4 pW. Fourier Transform Spectroscopy is a well-established method to measure broadband spectra with significant advantages over conventional dispersive spectrometers such as a higher power throughput and large signal-to-noise ratio for a given measurement time. By integrating a bilayer cantilever probe with a Michelson interferometer, the new platform is capable of measuring broadband absorptance spectra from 3prm to 18pm directly and quantitatively with an enhanced sensitivity that enables the characterization of micro- and nanometer-sized samples, which cannot be achieved by using conventional spectroscopic techniques. Besides, a paralleled project of a bi-armed cantilever decouples the sample arm and the probe arm to further enhance the signal-to-noise ratio.en_US
dc.description.statementofresponsibilityby Wei-Chun Hsu.en_US
dc.format.extent88 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectMechanical Engineering.en_US
dc.titleDirect and quantitative broadband absorptance micro/nano spectroscopy using FTIR and bilayer cantilever probesen_US
dc.title.alternativeDirect and quantitative broadband absorptance micro/nano spectroscopy using Fourier Transform Infrared Spectroscopy and bilayer cantilever probesen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineering
dc.identifier.oclc829815404en_US


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