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dc.contributor.advisorPaul L. Schechter.en_US
dc.contributor.authorJanish, Ryan J. (Ryan Joseph)en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Physics.en_US
dc.date.accessioned2013-04-12T19:37:48Z
dc.date.available2013-04-12T19:37:48Z
dc.date.copyright2012en_US
dc.date.issued2012en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/78543
dc.descriptionThesis (S.B.)--Massachusetts Institute of Technology, Dept. of Physics, 2012.en_US
dc.descriptionCataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (p. 57).en_US
dc.description.abstractIn this thesis, I present a new technique for measuring the optical aberrations produced by a telescope, with an eye towards future use of these aberration measurements to align wide-field telescopes. This method determines the aberrations by simultaneously fitting a pair of oppositely defocused images to a mostly analytic model. I develop the model and describe its software implementation in detail, and then report on the results of tests with simulated and real data. This technique is able to extract the aberrations from simulated data rapidly and accurately, and it has been used with mixed success to analyze data from the VISTA telescope. With the VISTA data, the algorithm is unable to match small-scale brightness variations in the images. However, it was able to determine aberrations with median accuracies of 0.08 um for coma, 0.08 um for astigmatism, 0.9 um for tilt, and 0.3 um for defocus. It was also quite fast, with an average of 34 iterations until convergence.en_US
dc.description.statementofresponsibilityby Ryan J. Janish.en_US
dc.format.extent57 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectPhysics.en_US
dc.titleAn algorithm for rapid measurement of aberrations in pairs of out-of-focus imagesen_US
dc.typeThesisen_US
dc.description.degreeS.B.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physics.en_US
dc.identifier.oclc836817391en_US


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