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dc.contributor.advisorGang Chen and Nicolas G. Hadjiconstantinou.en_US
dc.contributor.authorZeng, Lingpingen_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Mechanical Engineering.en_US
dc.date.accessioned2013-06-17T19:51:53Z
dc.date.available2013-06-17T19:51:53Z
dc.date.copyright2013en_US
dc.date.issued2013en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/79267
dc.descriptionThesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2013.en_US
dc.descriptionCataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (p. 99-107).en_US
dc.description.abstractKnowledge of phonon mean free path (MFP) distribution is critically important to engineering size effects. Phenomenological models of phonon relaxation times can give us some sense about the mean free path distribution, but they are not accurate. Further improvement of thermoelectric performance requires the phonon MFP to be known. In this thesis, we improve recently developed thermal conductivity spectroscopy technique to experimentally measure MFPs using ultrafast transient thermoreflectance method. By optically heating lithographically patterned metallic nanodot arrays, we are able to probe heat transfer at length scales down to 100 nm, far below the diffraction limit for visible light. We demonstrate the new implementation by measuring MFPs in sapphire at room temperature. A multidimensional transport model based on the grey phonon Boltzmann equation is developed and solved to study the quasi-ballistic transport occurring in the spectroscopy experiments. To account for the nonlinear dispersion relation, we present a variance reduced Monte Carlo scheme to solve the full Boltzmann transport equation and compare the simulation results with experimental data on silicon.en_US
dc.description.statementofresponsibilityby Lingping Zeng.en_US
dc.format.extent107 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectMechanical Engineering.en_US
dc.titleExperimental and numerical investigation of phonon mean free path distributionen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineering
dc.identifier.oclc846629386en_US


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