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dc.contributor.authorLiu, Jifeng
dc.contributor.authorSun, Xiaochen
dc.contributor.authorKimerling, Lionel C.
dc.contributor.authorMichel, Jurgen
dc.contributor.authorCamacho-Aguilera, Rodolfo Ernesto
dc.date.accessioned2013-07-26T16:19:49Z
dc.date.available2013-07-26T16:19:49Z
dc.date.issued2010-02
dc.date.submitted2010-01
dc.identifier.issn0146-9592
dc.identifier.issn1539-4794
dc.identifier.urihttp://hdl.handle.net/1721.1/79710
dc.description.abstractMonolithic lasers on Si are ideal for high-volume and large-scale electronic–photonic integration. Ge is an interesting candidate owing to its pseudodirect gap properties and compatibility with Si complementary metal oxide semiconductor technology. Recently we have demonstrated room-temperature photoluminescence, electroluminescence, and optical gain from the direct gap transition of band-engineered Ge-on-Si using tensile strain and n-type doping. Here we report what we believe to be the first experimental observation of lasing from the direct gap transition of Ge-on-Si at room temperature using an edge-emitting waveguide device. The emission exhibited a gain spectrum of 1590–1610 nm, line narrowing and polarization evolution from a mixed TE/TM to predominantly TE with increasing gain, and a clear threshold behavior.en_US
dc.description.sponsorshipUnited States. Air Force Office of Scientific Research. Multidisciplinary University Research Initiative (Si-based Laser Initiative)en_US
dc.language.isoen_US
dc.publisherOptical Society of Americaen_US
dc.relation.isversionofhttp://dx.doi.org/10.1364/OL.35.000679en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceMIT web domainen_US
dc.titleGe-on-Si laser operating at room temperatureen_US
dc.typeArticleen_US
dc.identifier.citationLiu, Jifeng, Xiaochen Sun, Rodolfo Camacho-Aguilera, Lionel C. Kimerling, and Jurgen Michel. “Ge-on-Si laser operating at room temperature.” Optics Letters 35, no. 5 (February 24, 2010): 679. © 2010 Optical Society of Americaen_US
dc.contributor.departmentMIT Materials Research Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Microphotonics Centeren_US
dc.contributor.mitauthorLiu, Jifengen_US
dc.contributor.mitauthorSun, Xiaochenen_US
dc.contributor.mitauthorCamacho-Aguilera, Rodolfo Ernestoen_US
dc.contributor.mitauthorKimerling, Lionel C.en_US
dc.contributor.mitauthorMichel, Jurgenen_US
dc.relation.journalOptics Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsLiu, Jifeng; Sun, Xiaochen; Camacho-Aguilera, Rodolfo; Kimerling, Lionel C.; Michel, Jurgenen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-3913-6189
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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