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dc.contributor.authorSchmidt, Frank Hall
dc.contributor.authorCahoy, Kerri
dc.contributor.authorSklair, Devon A.
dc.contributor.authorBlackwell, William J.
dc.contributor.authorOsarentin, I.
dc.contributor.authorLegge Jr, Robert S.
dc.contributor.authorKingsbury, Ryan W
dc.date.accessioned2013-09-25T19:21:31Z
dc.date.available2013-09-25T19:21:31Z
dc.date.issued2013-07
dc.identifier.urihttp://hdl.handle.net/1721.1/81179
dc.description.abstractIn this paper we report total dose test results of COTS components commonly used on CubeSats. We investigate a variety of analog integrated circuits, a popular microcontroller (PIC24) as well as SD memory cardsen_US
dc.language.isoen_US
dc.relation.isversionofhttp://www.nsrec.com/brochure2013.pdfen_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alike 3.0en_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/en_US
dc.sourceMIT web domainen_US
dc.titleTID Tolerance of Popular CubeSat Componentsen_US
dc.typeArticleen_US
dc.identifier.citationR. Kingsbury, F. Schmidt, K. Cahoy, D. Sklair. "TID Tolerance of Popular CubeSat Components" 50th Nuclear and Space Radiation Effects Conference 2013.en_US
dc.contributor.departmentLincoln Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Aeronautics and Astronauticsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Space Systems Laboratoryen_US
dc.contributor.mitauthorKingsbury, Ryan W.en_US
dc.contributor.mitauthorSchmidt, Frank Hallen_US
dc.contributor.mitauthorCahoy, Kerrien_US
dc.contributor.mitauthorSklair, Devon A.en_US
dc.contributor.mitauthorBlackwell, William J.en_US
dc.contributor.mitauthorOsarentin, I.en_US
dc.contributor.mitauthorLegge Jr, Robert S.en_US
dc.relation.journalProceedings of the 50th Nuclear and Space Radiation Effects Conference 2013en_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.identifier.orcidhttps://orcid.org/0000-0003-1552-4432
dc.identifier.orcidhttps://orcid.org/0000-0002-7791-5124
mit.licenseOPEN_ACCESS_POLICYen_US


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