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dc.contributor.advisorTonio Buonassisi.en_US
dc.contributor.authorBrandt, Riley Ericen_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Mechanical Engineering.en_US
dc.date.accessioned2013-10-24T17:32:51Z
dc.date.available2013-10-24T17:32:51Z
dc.date.copyright2013en_US
dc.date.issued2013en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/81593
dc.descriptionThesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2013.en_US
dc.descriptionCataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (p. 95-99).en_US
dc.description.abstractIn this thesis, I fabricated and characterized a series of thin-film cuprous oxide (Cu₂O) photovoltaic devices. I constructed several different device designs, using sputtered and electrochemically deposited Cu₂O. Characterization was done using XRD, SEM, optical spectroscopy, quantum efficiency, current-voltage, and capacitance-voltage measurements. Then, these devices were modeled using SCAPS-1D, a numerical simulation package, as well as MATLAB for analytical solutions. This simulation enabled a quantitative breakdown of efficiency losses in Cu 20 devices. Simulations suggest that low device efficiencies of 0.3-0.6% may be explained in part by poor bulk transport properties in the Cu₂O. However, the predominant efficiency loss comes from an unoptimized p-n heterojunction, in which a large negative conduction band offset and structural defects lead to a low built-in voltage and high recombination activity. The effects of interface engineering are demonstrated in experiment and simulation. Broader simulations suggest opportunities for future efficiency improvements towards 10%. These include the improvement of bulk properties, the selection of alternative pairing materials, novel device structures, and the possibility of multijunction cells.en_US
dc.description.statementofresponsibilityby Riley Eric Brandt.en_US
dc.format.extent99 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectMechanical Engineering.en_US
dc.titleElucidating efficiency losses in cuprous oxide (Cu₂O) photovoltaics and identifying strategies for efficiency improvementen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineering.en_US
dc.identifier.oclc858863658en_US


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