Electrical degradation of InAlAs/InGaAs metamorphic high electron mobility transistors
Name
43552091-MIT.pdf
Description
Full printable version
Size
4.56 MB
Format
Adobe PDF
Checksum (MD5)
69bc1044ce519ff707c8a49ff0c7ba05
Author(s)
Mertens, Samuel D. (Samuel David), 1975-
Advisor(s)
Jesús A. del Alamo and Lawrence G. Studebaker.
Date Issued
1999
Publisher
Massachusetts Institute of Technology
Description
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1999.
Includes bibliographical references (p. 97-102).
Subjects
Electrical Engineering and Computer Science
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
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