dc.contributor.advisor | Min-Chang Lee. | en_US |
dc.contributor.author | Riddolls, Ryan James, 1974- | en_US |
dc.contributor.other | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. | en_US |
dc.date.accessioned | 2014-01-23T18:29:00Z | |
dc.date.available | 2014-01-23T18:29:00Z | |
dc.date.copyright | 1999 | en_US |
dc.date.issued | 1999 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/84211 | |
dc.description | Thesis (M.Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1999. | en_US |
dc.description | Includes bibliographical references (p. 132-137). | en_US |
dc.description.statementofresponsibility | by Ryan James Riddolls. | en_US |
dc.format.extent | 137 p. | en_US |
dc.language.iso | eng | en_US |
dc.publisher | Massachusetts Institute of Technology | en_US |
dc.rights | M.I.T. theses are protected by
copyright. They may be viewed from this source for any purpose, but
reproduction or distribution in any format is prohibited without written
permission. See provided URL for inquiries about permission. | en_US |
dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | en_US |
dc.subject | Electrical Engineering and Computer Science. | en_US |
dc.title | Two-probe techniques to measure wavenumber-frequency spectrum of VTF plasma | en_US |
dc.title.alternative | 2-probe techniques to measure wavenumber-frequency spectrum of VTF plasma | en_US |
dc.type | Thesis | en_US |
dc.description.degree | M.Eng. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
dc.identifier.oclc | 44892446 | en_US |