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dc.contributor.advisorRoy Welsch and Kevin Amaratunga.en_US
dc.contributor.authorKnudsen, David Charles, 1972-en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Civil and Environmental Engineering.en_US
dc.date.accessioned2014-01-23T18:30:07Z
dc.date.available2014-01-23T18:30:07Z
dc.date.copyright2001en_US
dc.date.issued2001en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/84228
dc.descriptionThesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Civil and Environmental Engineering, 2001.en_US
dc.descriptionIncludes bibliographical references (p. 71).en_US
dc.description.statementofresponsibilityby David Charles Knudsen.en_US
dc.format.extent76 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectSloan School of Management.en_US
dc.subjectCivil and Environmental Engineering.en_US
dc.titleApplication of stastical quality control to improve yields and rationalize testing in a low volume manufacturing facilityen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Civil and Environmental Engineering
dc.contributor.departmentSloan School of Management
dc.identifier.oclc48863040en_US


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