A method for infrared temperature measurements of thin film materials with a low, unknown, and/or variable emissivity at low temperatures
Author(s)
Jarboe, Jason Neal
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Other Contributors
Massachusetts Institute of Technology. Department of Mechanical Engineering.
Advisor
Alexander H. Slocum.
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Accurate non-contact temperature measurements of objects using thermal radiation is often limited by low emission of IR radiation because of low temperatures and/or emissivities, or by the unknown or changing emissivity of the material being measured. This thesis covers an effort to build a practical, inexpensive, and widely applicable non-contact system for accurately measuring the temperatures of materials of low, unknown, and/or variable emissivity. The method to be used is intended specifically for those objects at low temperatures (below 100 degrees Celsius), which are conventionally the most difficult to accurately measure.
Description
Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2013. Cataloged from PDF version of thesis. Includes bibliographical references.
Date issued
2013Department
Massachusetts Institute of Technology. Department of Mechanical EngineeringPublisher
Massachusetts Institute of Technology
Keywords
Mechanical Engineering.