A method for infrared temperature measurements of thin film materials with a low, unknown, and/or variable emissivity at low temperatures

Abstract

Accurate non-contact temperature measurements of objects using thermal radiation is often limited by low emission of IR radiation because of low temperatures and/or emissivities, or by the unknown or changing emissivity of the material being measured. This thesis covers an effort to build a practical, inexpensive, and widely applicable non-contact system for accurately measuring the temperatures of materials of low, unknown, and/or variable emissivity. The method to be used is intended specifically for those objects at low temperatures (below 100 degrees Celsius), which are conventionally the most difficult to accurately measure.