dc.contributor.advisor | Mildred S. Dresselhaus and Daniel E. Oates. | en_US |
dc.contributor.author | Habib, Youssef M., 1960- | en_US |
dc.date.accessioned | 2014-02-10T16:42:08Z | |
dc.date.available | 2014-02-10T16:42:08Z | |
dc.date.copyright | 1999 | en_US |
dc.date.issued | 1999 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/84746 | |
dc.description | Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Physics, 1999. | en_US |
dc.description | Includes bibliographical references (p. 106-113). | en_US |
dc.description.statementofresponsibility | by Youssef M. Habib. | en_US |
dc.format.extent | 113 p. | en_US |
dc.language.iso | eng | en_US |
dc.publisher | Massachusetts Institute of Technology | en_US |
dc.rights | M.I.T. theses are protected by
copyright. They may be viewed from this source for any purpose, but
reproduction or distribution in any format is prohibited without written
permission. See provided URL for inquiries about permission. | en_US |
dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | en_US |
dc.subject | Physics | en_US |
dc.title | Microwave frequency power dependence in high-Tc thin films, grain boundaries, and Josephson junctions | en_US |
dc.type | Thesis | en_US |
dc.description.degree | Ph.D. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Physics | en_US |
dc.identifier.oclc | 42624313 | en_US |