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dc.contributor.advisorMildred S. Dresselhaus and Daniel E. Oates.en_US
dc.contributor.authorHabib, Youssef M., 1960-en_US
dc.date.accessioned2014-02-10T16:42:08Z
dc.date.available2014-02-10T16:42:08Z
dc.date.copyright1999en_US
dc.date.issued1999en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/84746
dc.descriptionThesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Physics, 1999.en_US
dc.descriptionIncludes bibliographical references (p. 106-113).en_US
dc.description.statementofresponsibilityby Youssef M. Habib.en_US
dc.format.extent113 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectPhysicsen_US
dc.titleMicrowave frequency power dependence in high-Tc thin films, grain boundaries, and Josephson junctionsen_US
dc.typeThesisen_US
dc.description.degreePh.D.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.identifier.oclc42624313en_US


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