Electromigration behavior and reliability of bamboo Al(Cu) interconnects for integrated circuits
Author(s)
Srikar, V. T. (Vengallatore Thattai), 1972-![Thumbnail](/bitstream/handle/1721.1/85249/42620931-MIT.pdf.jpg?sequence=5&isAllowed=y)
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Advisor
Carl V. Thompson.
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Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1999. Includes bibliographical references (leaves 103-108).
Date issued
1999Department
Massachusetts Institute of Technology. Department of Materials Science and EngineeringPublisher
Massachusetts Institute of Technology
Keywords
Materials Science and Engineering