Critical-current reduction in thin superconducting wires due to current crowding

Author(s)
Berggren, Karl K.; Hortensius, H. L.; Driessen, E. F. C.; Klapwijk, T. M.; Clem, John R.
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Abstract
We demonstrate experimentally that the critical current in superconducting NbTiN wires is dependent on their geometrical shape, due to current-crowding effects. Geometric patterns such as 90˚ corners and sudden expansions of wire width are shown to result in the reduction of critical currents. The results are relevant for single-photon detectors as well as parametric amplifiers.
Date issued
2012-05
URI
http://hdl.handle.net/1721.1/85960
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science; Massachusetts Institute of Technology. Research Laboratory of Electronics
Journal
Applied Physics Letter
Publisher
American Institute of Physics (AIP)
Citation
Hortensius, H. L. et al. “Critical-Current Reduction in Thin Superconducting Wires due to Current Crowding.” Applied Physics Letters 100.18 (2012): 182602.
Version: Author's final manuscript
ISSN
0003-6951
1077-3118
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