Critical-current reduction in thin superconducting wires due to current crowding
Author(s)Berggren, Karl K.; Hortensius, H. L.; Driessen, E. F. C.; Klapwijk, T. M.; Clem, John R.
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We demonstrate experimentally that the critical current in superconducting NbTiN wires is dependent on their geometrical shape, due to current-crowding effects. Geometric patterns such as 90˚ corners and sudden expansions of wire width are shown to result in the reduction of critical currents. The results are relevant for single-photon detectors as well as parametric amplifiers.
DepartmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science; Massachusetts Institute of Technology. Research Laboratory of Electronics
Applied Physics Letter
American Institute of Physics (AIP)
Hortensius, H. L. et al. “Critical-Current Reduction in Thin Superconducting Wires due to Current Crowding.” Applied Physics Letters 100.18 (2012): 182602.
Author's final manuscript