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dc.contributor.authorRen, Y.
dc.contributor.authorHovenier, J. N.
dc.contributor.authorCui, M.
dc.contributor.authorHayton, D. J.
dc.contributor.authorGao, J. R.
dc.contributor.authorKlapwijk, T. M.
dc.contributor.authorShi, S. C.
dc.contributor.authorReno, J. L.
dc.contributor.authorKao, Tsung-Yu
dc.contributor.authorHu, Qing
dc.date.accessioned2014-05-01T19:56:11Z
dc.date.available2014-05-01T19:56:11Z
dc.date.issued2012-01
dc.date.submitted2011-11
dc.identifier.issn00036951
dc.identifier.issn1077-3118
dc.identifier.urihttp://hdl.handle.net/1721.1/86350
dc.description.abstractWe report frequency locking of two 3.5-THz third-order distributed feedback (DFB)quantum cascade lasers(QCLs) by using methanol molecular absorption lines, a proportional-integral-derivative controller, and a NbN bolometer. We show that the free-running linewidths of the QCLs are dependent on the electrical and temperature tuning coefficients. For both lasers, the frequency locking induces a similar linewidth reduction factor, whereby the narrowest locked linewidth is below 18 kHz with a Gaussian-like shape. The linewidth reduction factor and the ultimate linewidth correspond to the measured frequency noise power spectral density.en_US
dc.description.sponsorshipUnited States. National Aeronautics and Space Administrationen_US
dc.description.sponsorshipNational Science Foundation (U.S.)en_US
dc.language.isoen_US
dc.publisherAmerican Institute of Physics (AIP)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.3679620en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceMIT web domainen_US
dc.titleFrequency locking of single-mode 3.5-THz quantum cascade lasers using a gas cellen_US
dc.typeArticleen_US
dc.identifier.citationRen, Y., J. N. Hovenier, M. Cui, D. J. Hayton, J. R. Gao, T. M. Klapwijk, S. C. Shi, T.-Y. Kao, Q. Hu, and J. L. Reno. “Frequency Locking of Single-Mode 3.5-THz Quantum Cascade Lasers Using a Gas Cell.” Appl. Phys. Lett. 100, no. 4 (2012): 041111. © 2012 American Institute of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.mitauthorKao, Tsung-Yuen_US
dc.contributor.mitauthorHu, Qingen_US
dc.relation.journalApplied Physics Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsRen, Y.; Hovenier, J. N.; Cui, M.; Hayton, D. J.; Gao, J. R.; Klapwijk, T. M.; Shi, S. C.; Kao, T.-Y.; Hu, Q.; Reno, J. L.en_US
dc.identifier.orcidhttps://orcid.org/0000-0003-1982-4053
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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