| dc.contributor.advisor | David H. Staelin. | en_US |
| dc.contributor.author | Lee, Junehee, 1969- | en_US |
| dc.contributor.other | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. | en_US |
| dc.date.accessioned | 2014-05-07T16:41:11Z | |
| dc.date.available | 2014-05-07T16:41:11Z | |
| dc.date.copyright | 2000 | en_US |
| dc.date.issued | 2000 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/86437 | |
| dc.description | Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2000. | en_US |
| dc.description | Includes bibliographical references (leaves 137-140). | en_US |
| dc.description.statementofresponsibility | by Junehee Lee. | en_US |
| dc.format.extent | 140 leaves | en_US |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | en_US |
| dc.subject | Electrical Engineering and Computer Science. | en_US |
| dc.title | Blind noise estimation and compensation for improved characterization of multivariable processes | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | Ph.D. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
| dc.identifier.oclc | 46802803 | en_US |
