An expert system to detect and diagnose failures in DRAM

Author(s)
Satish, Venkatesh, 1976-
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Alternative title
Expert system to detect and diagnose failures in dynamic randon-access memory
Other Contributors
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.
Advisor
Srinivas Devadas.
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Description
Thesis (M.Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2000.
 
Includes bibliographical references (leaves 63-64).
 
Date issued
2000
URI
http://hdl.handle.net/1721.1/86489
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Publisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science.
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