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dc.contributor.advisorAnantha P. Chandrakasan.en_US
dc.contributor.authorCalhoun, Benton H. (Benton Highsmith), 1978-en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2014-05-23T19:06:23Z
dc.date.available2014-05-23T19:06:23Z
dc.date.copyright2002en_US
dc.date.issued2002en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/87199
dc.descriptionThesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2002.en_US
dc.descriptionIncludes bibliographical references (p. 115-118).en_US
dc.description.statementofresponsibilityby Benton Highsmith Calhoun.en_US
dc.format.extent118 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleCircuit techniques for subthreshold leakage reduction in a deep sub-micron processen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc51160375en_US


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