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dc.contributor.advisorRajeev J. Ram.en_US
dc.contributor.authorMayer, Peter (Peter Matthew), 1978-en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2014-05-23T19:11:11Z
dc.date.available2014-05-23T19:11:11Z
dc.date.copyright2002en_US
dc.date.issued2002en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/87247
dc.descriptionThesis (M.Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2002.en_US
dc.descriptionIncludes bibliographical references (p. 157-162).en_US
dc.description.statementofresponsibilityby Peter Mayer.en_US
dc.format.extent162 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleCurrent fluctuations in semiconductor devicesen_US
dc.typeThesisen_US
dc.description.degreeM.Eng.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc51451735en_US


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