Investigation of noise sources in scaled CMOS field-effect transistors

Author(s)
Sepke, Todd C. (Todd Christopher), 1975-
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Alternative title
Investigation of noise sources in scaled complementary metal oxide semiconductors field-effect transistors
Other Contributors
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.
Advisor
Hae-Seung Lee and Charles G. Sodini.
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Description
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2002.
 
MIT Institute Archives hard copy: p. 101-102 bound 102-101; p. 102 blank.
 
Includes bibliographical references (p. 97-101).
 
Date issued
2002
URI
http://hdl.handle.net/1721.1/87824
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Publisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science.
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