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dc.contributor.advisorKamal Youcef-Toumi.en_US
dc.contributor.authorYeo, Yee, 1977-en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Mechanical Engineering.en_US
dc.date.accessioned2014-08-19T17:33:36Z
dc.date.available2014-08-19T17:33:36Z
dc.date.copyright2000en_US
dc.date.issued2000en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/88854
dc.descriptionThesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2000.en_US
dc.descriptionIncludes bibliographical references (leaves 72-75).en_US
dc.description.statementofresponsibilityby Yee Yeo.en_US
dc.format.extent75 leavesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectMechanical Engineering.en_US
dc.titleImage processing for precision atomic force microscopyen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineering.en_US
dc.identifier.oclc46241207en_US


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