dc.contributor.advisor | Douglas P. Hart. | en_US |
dc.contributor.author | Tan, Sheng, 1976- | en_US |
dc.contributor.other | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. | en_US |
dc.date.accessioned | 2014-09-09T17:57:06Z | |
dc.date.available | 2014-09-09T17:57:06Z | |
dc.date.copyright | 2002 | en_US |
dc.date.issued | 2002 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/89368 | |
dc.description | Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2002. | en_US |
dc.description | Includes bibliographical references (leaves 82-84). | en_US |
dc.description.statementofresponsibility | by Sheng Tan. | en_US |
dc.format.extent | 84 leaves | en_US |
dc.language.iso | eng | en_US |
dc.publisher | Massachusetts Institute of Technology | en_US |
dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | en_US |
dc.subject | Mechanical Engineering. | en_US |
dc.subject | Electrical Engineering and Computer Science. | en_US |
dc.title | Particle displacement measurement using optical diffraction | en_US |
dc.type | Thesis | en_US |
dc.description.degree | S.M. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
dc.contributor.department | Massachusetts Institute of Technology. Department of Mechanical Engineering | |
dc.identifier.oclc | 51831720 | en_US |