Statistical usage models in mobile processor thermal design and testing
Author(s)Evans, Thomas C. (Thomas Carl), 1971-
Statistical usage models in mobile microprocessor thermal design and testing
Leaders for Manufacturing Program.
Daniel E. Whitney and Roy E. Welsch.
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Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering; and, (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; in conjunction with the Leaders for Manufacturing Program at MIT, 2003.Includes bibliographical references (p. 77).
DepartmentLeaders for Manufacturing Program at MIT; Massachusetts Institute of Technology. Department of Mechanical Engineering; Sloan School of Management
Massachusetts Institute of Technology
Mechanical Engineering., Sloan School of Management., Leaders for Manufacturing Program.