Statistical usage models in mobile processor thermal design and testing
Author(s)
Evans, Thomas C. (Thomas Carl), 1971-
DownloadFull printable version (8.040Mb)
Alternative title
Statistical usage models in mobile microprocessor thermal design and testing
Other Contributors
Leaders for Manufacturing Program.
Advisor
Daniel E. Whitney and Roy E. Welsch.
Terms of use
Metadata
Show full item recordDescription
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering; and, (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; in conjunction with the Leaders for Manufacturing Program at MIT, 2003. Includes bibliographical references (p. 77).
Date issued
2003Department
Leaders for Manufacturing Program at MIT; Massachusetts Institute of Technology. Department of Mechanical Engineering; Sloan School of ManagementPublisher
Massachusetts Institute of Technology
Keywords
Mechanical Engineering., Sloan School of Management., Leaders for Manufacturing Program.