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dc.contributor.authorMazumdar, Arya
dc.contributor.authorChandar, Venkat B.
dc.contributor.authorWornell, Gregory W.
dc.date.accessioned2014-10-21T17:33:16Z
dc.date.available2014-10-21T17:33:16Z
dc.date.issued2014-04
dc.date.submitted2013-12
dc.identifier.issn0733-8716
dc.identifier.urihttp://hdl.handle.net/1721.1/91128
dc.description.abstractMotivated by distributed storage applications, we investigate the degree to which capacity achieving codes can be efficiently updated when a single information symbol changes, and the degree to which such codes can be efficiently repaired when a single encoded symbol is lost. Specifically, we first develop conditions under which optimum error-correction and update-efficiency are possible. We establish that the number of encoded bits that should change in response to a change in a single information bit must scale logarithmically in the block-length of the code, if we are to achieve any nontrivial rate with vanishing probability of error over the binary erasure or binary symmetric channels. Moreover, we show that there exist capacity-achieving codes with this scaling. With respect to local repairability, we develop tight upper and lower bounds on the number of remaining encoded bits that are needed to recover a single lost encoded bit. In particular, we show that when the rate of an optimal code is ε below capacity, the maximum number of codeword symbols required to recover one lost symbol must scale as log1/ε. Several variations on-and extensions of-these results are also developed, including to the problem of rate-distortion coding.en_US
dc.description.sponsorshipUnited States. Air Force Office of Scientific Research (Grant FA9550-11-1-0183)en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Grant CCF-1017772)en_US
dc.description.sponsorshipUniversity of Minnesotaen_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/jsac.2014.140517en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourcearXiven_US
dc.titleUpdate-Efficiency and Local Repairability Limits for Capacity Approaching Codesen_US
dc.typeArticleen_US
dc.identifier.citationMazumdar, Arya, Venkat Chandar, and Gregory W. Wornell. “Update-Efficiency and Local Repairability Limits for Capacity Approaching Codes.” IEEE Journal on Selected Areas in Communications 32, no. 5 (May 2014): 976–988.en_US
dc.contributor.departmentLincoln Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.mitauthorMazumdar, Aryaen_US
dc.contributor.mitauthorChandar, Venkat B.en_US
dc.contributor.mitauthorWornell, Gregory W.en_US
dc.relation.journalIEEE Journal on Selected Areas in Communicationsen_US
dc.eprint.versionOriginal manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsMazumdar, Arya; Chandar, Venkat; Wornell, Gregory W.en_US
dc.identifier.orcidhttps://orcid.org/0000-0001-9166-4758
dspace.mitauthor.errortrue
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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