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Density Profile Measurements in LDX using Microwave Reflectometry

dc.contributor.authorWills, R.C.en_US
dc.contributor.authorDavis, M.en_US
dc.contributor.authorWoskov, P.P.en_US
dc.contributor.authorKesner, J.en_US
dc.contributor.authorGarnier, D.T.en_US
dc.contributor.authorMauel, M.E.en_US
dc.date.accessioned2015-02-03T02:15:34Z
dc.date.available2015-02-03T02:15:34Z
dc.date.issued2010-09-13en_US
dc.identifier10rr009en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/93327
dc.publisherMIT Plasma Science & Fusion Centeren_US
dc.titleDensity Profile Measurements in LDX using Microwave Reflectometryen_US


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