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dc.contributor.advisorAlexander Slocum.en_US
dc.contributor.authorBalakrishnan, Asha, 1974-en_US
dc.date.accessioned2005-08-22T18:06:42Z
dc.date.available2005-08-22T18:06:42Z
dc.date.copyright1999en_US
dc.date.issued1999en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/9404
dc.descriptionThesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1999.en_US
dc.descriptionIncludes bibliographical references (p. 96).en_US
dc.description.abstractThe objective of this work was to determine the feasibility of Ball Grid Array (BGA) planarization and to investigate the effects of mechanical contacts on signal integrity for high­speed digital signals. As devices become smaller and clock frequencies increase, new technologies for contacting devices are being developed, especially in the field of semiconductor test. These contactors will be incorporated into a socket or an interconnect used in testing devices or printed circuit boards. The heights of the solder ball leads on BGA packages have a high degree of co-planarity. As BGA pitches become tighter, the requirement for improved co-planarity persists. This thesis shows that through diamond turning techniques, the co-planarity of the solder ball leads can be improved. Planarization of solder balls enables the use and development of rigid interconnects. Interconnections generally have a built in compliance to them to accommodate for co-planarity. Reducing co-planarity eliminates the need for compliant interconnects. Contact mechanics identifies the conical shaped tip as the optimal tip shape, providing the best mechanical connection. The intent of the tip shape investigation is to correlate indentation theory with signal integrity. The electrical performance of the contactor tip is evaluated using the industry standard pogo pin. Mechanical parameters are varied to observe the effect on the signal integrity. At high frequencies, the interconnect provides a vulnerable location for signal losses to occur. A new interconnect design to address the electrical performance of existing designs is introduced. The cantilevered interconnect consists of a coplanar waveguide cross-section. The interconnect is both mechanically and electrically sound. This thesis presents aspects of mechanical contact interfaces for electrical signal testing purposes. It focuses on device interfacing, contactor tip shape, signal integrity and new interconnect designs.en_US
dc.description.statementofresponsibilityby Asha Balakrishnan.en_US
dc.format.extent108 p.en_US
dc.format.extent8074600 bytes
dc.format.extent8074358 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectMechanical Engineeringen_US
dc.titleContact-type mechanical interfaces for high speed digital interconnectsen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.identifier.oclc43181367en_US


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