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dc.contributor.advisorHarry L. Tuller.en_US
dc.contributor.authorKim Jae Jin, Ph. Den_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Materials Science and Engineering.en_US
dc.date.accessioned2015-09-17T19:08:42Z
dc.date.available2015-09-17T19:08:42Z
dc.date.copyright2015en_US
dc.date.issued2015en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/98737
dc.descriptionThesis: Ph. D., Massachusetts Institute of Technology, Department of Materials Science and Engineering, 2015.en_US
dc.descriptionIn title on title-page, double underscored characters appear as subscript (Prx̳Ce1̳-̳x̳O2̳-̳[̳d̳e̳l̳t̳a̳]̳) Cataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 129-134).en_US
dc.description.abstractAn improved fundamental understanding of oxygen defect equilibria and transport kinetics in oxides is essential for achieving enhanced performance and longevity in many oxide-based practical applications. The ability to diagnose a material's behavior in a thin film structure under operating conditions (in operando), ideally in situ, is therefore of importance. In this dissertation, a novel experimental technique capable of simultaneously performing in situ and in operando optical absorption and electrochemical impedance spectroscopy (EIS) measurements was developed and utilized, for the first time, over a range of temperatures and controlled atmospheres. The technique was applied to the Prx̳Ce1̳-̳x̳O2̳-̳[̳d̳e̳l̳t̳a̳]̳, (PCO) model thin film system. PCO shows mixed ionic and electronic conducting (MIEC) characteristics at relatively high pO2 regimes (e.g. air), which is beneficial for solid oxide fuel cells (SOFCs) cathode performance. The Pr impurity levels in PCO allow for optical transitions (2.0 - 3.3 eV), leading to the red coloration of oxidized samples. A change in the redox state of Pr results in a color change and so serves as a means of investigating the Pr oxidation state and thereby oxygen non-stoichiometry. Pr⁴⁺ concentrations, derived independently from optical and electrochemical measurements, and their corresponding trends, were found to be self-consistent, confirming that the oxygen reduction enthalpy in thin film 10PCO is lower than that in the bulk. The derived extinction coefficient, . . . , can now be utilized to study defect equilibria of PCO or other relevant oxide films by optical means alone. The oxygen surface exchange reaction kinetics, driven by chemical and electrical driving forces, were investigated and correlated to each other, with the aid of the thermodynamic factor. The impact of surface chemistry and metal current collector on the reaction kinetics was discussed. A specially designed cell structure enabled the extension of the oxygen diffusion pathway, allowing for the monitoring of color front migration in PCO films. Such optical color front motion experiments offer the opportunity for in situ, more rapid and reversible investigation of oxygen diffusion kinetics in thin films and open new opportunities to study materials' spatially distinguishable properties.en_US
dc.description.statementofresponsibilityby Jae Jin Kim.en_US
dc.format.extent134 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectMaterials Science and Engineering.en_US
dc.titleDefect equilibria and electrode kinetics in Prx̳Ce1̳-̳x̳O2̳-̳[̳d̳e̳l̳t̳a̳]̳ mixed conducting thin films : an in-situ optical and electrochemical investigationen_US
dc.title.alternativeDefect equilibria and electrode kinetics in PCO mixed conducting thin films : an in-situ optical and electrochemical investigationen_US
dc.typeThesisen_US
dc.description.degreePh. D.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineering
dc.identifier.oclc920877816en_US


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