2026-09-19T12:52:49Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/100452022-01-13T07:54:29Zcom_1721.1_7582com_1721.1_7581col_1721.1_131022
Duane S. Bonging, James E. Chung.
Stine, Brian E. (Brian Eugene), 1971-
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2005-08-18T23:53:58Z
2005-08-18T23:53:58Z
1997
1998
http://hdl.handle.net/1721.1/10045
39134597
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998.
Includes bibliographical references (leaves 186-192).
by Brian E. Stine.
Ph.D.
192 leaves
15337956 bytes
15337715 bytes
application/pdf
application/pdf
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Electrical Engineering and Computer Science
A general methodology for assessing and characterizing variation in semiconductor manufacturing
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