2026-09-20T21:42:40Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/1013062021-07-05T14:03:20Zcom_1721.1_7582com_1721.1_7581col_1721.1_131023
Leonard A. Gould.
Hersh, Rodney Robert
Massachusetts Institute of Technology. Department of Electrical Engineering
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2016-02-29T14:58:56Z
2016-02-29T14:58:56Z
1972
http://hdl.handle.net/1721.1/101306
24171350
Massachusetts Institute of Technology. Dept. of Electrical Engineering. Thesis. 1972. M.S.
MICROFICHE COPY ALSO AVAILABLE IN BARKER ENGINEERING LIBRARY.
Bibliography: leaf 47.
M.S.
47 leaves
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Electrical Engineering
The effects of noise on measurements made in a distributed parameter system.
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