2026-09-19T12:55:34Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/1015882022-01-13T07:54:01Zcom_1721.1_7582com_1721.1_7581col_1721.1_131023
Yury Polyanskiy.
Tang, Jennifer (Jennifer Susan)
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2016-03-03T21:10:43Z
2016-03-03T21:10:43Z
2015
2015
http://hdl.handle.net/1721.1/101588
940982539
Thesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2015.
Cataloged from PDF version of thesis.
Includes bibliographical references (page 75).
This project analyzes designs for physical redundancy which are modeled abstractly as a bipartite graph. The goal is to determine the characteristics of graph structures which optimize the trade-off between the number of edges and the number of redundant components or nodes needed while correcting a deterministic number of worst-case errors. This thesis looks at finite-sized designs, asymptotically large designs with finite error correcting values, and designs with asymptotically large error correcting values. Results include some small optimal graph structures and fundamental limits on what the optimal design structure can achieve for the cases where a small number of errors are corrected and for where the number of errors to be correctly grows asymptotically.
by Jennifer Tang.
S.M.
75 pages
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Electrical Engineering and Computer Science.
Physical redundancy for defect tolerance : example designs and fundamental limits
Thesis
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