<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-19T16:25:02Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/106391" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/106391</identifier><datestamp>2026-06-06T00:49:40Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131023</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Ruonan Han and Siddharth Sundar.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">Wu, Michael A., M. Eng Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="other" lang="en_US">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2017-01-12T18:18:53Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="available">2017-01-12T18:18:53Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">2016</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="issued" lang="en_US">2016</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="uri">http://hdl.handle.net/1721.1/106391</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="oclc" lang="en_US">967666055</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2016.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">This electronic version was submitted by the student author.  The certified thesis is available in the Institute Archives and Special Collections.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Cataloged from student-submitted PDF version of thesis.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (pages 57-58).</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">This thesis describes the design and implementation of an evaluation system for Silicon Labs' current sensor products. The system provides significant advantages over existing evaluation systems by reducing hazardous voltages and currents through increased sense resistance and improving simplicity through a modular motherboard, daughtercard, and software system. The system is versatile and supports modifications for additional customization. All existing Silicon Labs' current sensor products are implemented in the system. The performance of the constructed evaluation system is shown to exceed existing work. The constructed system uses lower currents, requires fewer specialized components, improves portability, and provides access to advanced product functionality.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by Michael A. Wu.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree" lang="en_US">M.Eng.</dim:field>
   <dim:field mdschema="dc" element="format" qualifier="extent" lang="en_US">58 pages</dim:field>
   <dim:field mdschema="dc" element="language" qualifier="iso" lang="en_US">eng</dim:field>
   <dim:field mdschema="dc" element="publisher" lang="en_US">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights" lang="en_US">M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.</dim:field>
   <dim:field mdschema="dc" element="rights" qualifier="uri" lang="en_US">http://dspace.mit.edu/handle/1721.1/7582</dim:field>
   <dim:field mdschema="dc" element="subject" lang="en_US">Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="title" lang="en_US">A common platform for current sensor evaluation in industrial automation applications</dim:field>
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   	&lt;Title>A common platform for current sensor evaluation in industrial automation applications&lt;/Title>
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   	&lt;PublicationDate>2016&lt;/PublicationDate>
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        	&lt;DisplayName>Wu, Michael A., M. Eng Massachusetts Institute of Technology&lt;/DisplayName>
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    &lt;Keyword>Electrical Engineering and Computer Science.&lt;/Keyword>
   	&lt;Abstract>This thesis describes the design and implementation of an evaluation system for Silicon Labs&amp;apos; current sensor products. The system provides significant advantages over existing evaluation systems by reducing hazardous voltages and currents through increased sense resistance and improving simplicity through a modular motherboard, daughtercard, and software system. The system is versatile and supports modifications for additional customization. All existing Silicon Labs&amp;apos; current sensor products are implemented in the system. The performance of the constructed evaluation system is shown to exceed existing work. The constructed system uses lower currents, requires fewer specialized components, improves portability, and provides access to advanced product functionality.&lt;/Abstract>
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