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Stanley Gershwin. Ismail, Elyud Massachusetts Institute of Technology. Department of Mechanical Engineering. Massachusetts Institute of Technology. Department of Mechanical Engineering 2017-02-22T15:59:35Z 2017-02-22T15:59:35Z 2016 2016 http://hdl.handle.net/1721.1/107027 971200019 Thesis: M. Eng. in Advanced Manufacturing and Design, Massachusetts Institute of Technology, Department of Mechanical Engineering, 2016. This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections. Cataloged from student-submitted PDF version of thesis. Includes bibliographical references (pages 95-96). This thesis addresses the improvement of first pass yield on the assembly floor of Varian Semiconductor Equipment and Associates (Varian) - a low volume complex semiconductor capital equipment manufacturing facility. First pass yield refers to the proportion of fully built modules that pass testing without the need for additional rework. The first pass yield (FPY) project began in 2011 and showed steady improvement for its first three years. But over the following two years, the primary yield metric has stayed level. The goal of the work presented here is to analyze the reasons for the leveling and propose novel ways of improving the metric once more. Two major quality improvement recommendations are presented in this thesis. The first is a new way of categorizing error reports that will lead to targeted corrective action to reduce the recurrence of pre-identified failure modes. A multi-step methodology is presented on how to determine an efficient corrective action, along with a case study based on data acquired from Varian. The second quality improvement recommendation involves reducing the number of part and sub-assembly shortages on the assembly floor that were shown to be correlated with poor first pass yield. A new management system for a subset of the total inventory at Varian is presented, along with a discussion on how to execute the recommendation. by Elyud Ismail. M.Eng. in Advanced Manufacturing and Design 96 pages eng Massachusetts Institute of Technology MIT theses are protected by copyright. They may be viewed, downloaded, or printed from this source but further reproduction or distribution in any format is prohibited without written permission. http://dspace.mit.edu/handle/1721.1/7582 Mechanical Engineering. Quality improvement at a semiconductor equipment manufacturing facility through error re-categorization and proper inventory management Thesis application/pdf false Publication unknown unknown <Publication xmlns="https://www.openaire.eu/cerif-profile/1.1/" id="f6fae4fe-64b5-4ff6-bf04-73e6a9344d32"> <Type xmlns="https://www.openaire.eu/cerif-profile/vocab/COAR_Publication_Types">http://purl.org/coar/resource_type/c_1843</Type> <Language>eng</Language> <Title>Quality improvement at a semiconductor equipment manufacturing facility through error re-categorization and proper inventory management</Title> <PublishedIn> <Publication> </Publication> </PublishedIn> <PublicationDate>2016</PublicationDate> <Authors> <Author> <DisplayName>Ismail, Elyud</DisplayName> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> </Authors> <Editors> </Editors> <Publishers> <Publisher> <DisplayName>Massachusetts Institute of Technology</DisplayName> <OrgUnit /> </Publisher> </Publishers> <License>http://dspace.mit.edu/handle/1721.1/7582</License> <Keyword>Mechanical Engineering.</Keyword> <Abstract>This thesis addresses the improvement of first pass yield on the assembly floor of Varian Semiconductor Equipment and Associates (Varian) - a low volume complex semiconductor capital equipment manufacturing facility. First pass yield refers to the proportion of fully built modules that pass testing without the need for additional rework. The first pass yield (FPY) project began in 2011 and showed steady improvement for its first three years. But over the following two years, the primary yield metric has stayed level. The goal of the work presented here is to analyze the reasons for the leveling and propose novel ways of improving the metric once more. Two major quality improvement recommendations are presented in this thesis. The first is a new way of categorizing error reports that will lead to targeted corrective action to reduce the recurrence of pre-identified failure modes. A multi-step methodology is presented on how to determine an efficient corrective action, along with a case study based on data acquired from Varian. The second quality improvement recommendation involves reducing the number of part and sub-assembly shortages on the assembly floor that were shown to be correlated with poor first pass yield. A new management system for a subset of the total inventory at Varian is presented, along with a discussion on how to execute the recommendation.</Abstract> <Access xmlns="http://purl.org/coar/access_right" > </Access> </Publication>