2026-09-18T22:16:44Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/109972022-01-13T07:54:32Zcom_1721.1_7582com_1721.1_7581col_1721.1_131023
Harry L. Tuller.
Chen, Thomas D. (Thomas Duhwa)
Massachusetts Institute of Technology. Department of Materials Science and Engineering
2005-08-18T15:50:42Z
2005-08-18T15:50:42Z
1996
1996
http://hdl.handle.net/1721.1/10997
35954031
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1996.
Includes bibliographical references (leaves 75-78).
by Thomas D. Chen.
M.S.
78 leaves
6458508 bytes
6458265 bytes
application/pdf
application/pdf
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Materials Science and Engineering
Electrically active defects in zinc oxide
Thesis
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