2026-09-19T05:40:07Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/111182022-01-13T07:54:29Zcom_1721.1_7582com_1721.1_7581col_1721.1_131023
Donald E. Troxel.
Kao, James T. (James Ting Yu)
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2005-08-17T23:31:51Z
2005-08-17T23:31:51Z
1995
1995
http://hdl.handle.net/1721.1/11118
34188746
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.
Includes bibliographical references (p. 107-108).
by James T. Kao.
M.S.
114 p.
8145446 bytes
8145205 bytes
application/pdf
application/pdf
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Electrical Engineering and Computer Science
Remote microscope for inspection of integrated circuits
Thesis
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