<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-20T19:02:23Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/112003" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/112003</identifier><datestamp>2022-01-13T07:54:01Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131023</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Jing Kong.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">Shen, Pin-Chun</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="other" lang="en_US">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2017-10-30T15:03:55Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="available">2017-10-30T15:03:55Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">2017</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="issued" lang="en_US">2017</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="uri">http://hdl.handle.net/1721.1/112003</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="oclc" lang="en_US">1006507317</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2017.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">This electronic version was submitted by the student author.  The certified thesis is available in the Institute Archives and Special Collections.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Cataloged from student-submitted PDF version of thesis.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (pages 54-55).</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">Two-dimensional semiconducting materials such as MoS₂ and WS₂ have been attractive for use in ultra-scaled electronic and optoelectronic devices because of their atomically-thin thickness, direct band gap, and lack of dangling bonds. Methods for large-area growth of 2D semiconducting materials are needed to bring them to practical applications. This thesis aims to develop reliable methods for growing high-quality monolayer MoS₂ and WS₂ by CVD and explore their intrinsic electrical transport properties for electronic and optoelectronic device applications. The as-grown monolayer MoS₂ and WS₂ exhibit n-type semiconducting behavior with excellent optical properties. Various techniques are employed to characterize the CVD-grown materials, including photoluminescence, UV-visible absorption, Raman spectroscopy, X-ray photoelectron spectroscopy, and atomic force microscopy. Moreover, the electronic transport characteristics of single-layer CVD-grown MoS₂ and WS₂ field-effect transistors with a back-gated configuration are demonstrated.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by Pin-Chun Shen.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree" lang="en_US">S.M.</dim:field>
   <dim:field mdschema="dc" element="format" qualifier="extent" lang="en_US">55 pages</dim:field>
   <dim:field mdschema="dc" element="language" qualifier="iso" lang="en_US">eng</dim:field>
   <dim:field mdschema="dc" element="publisher" lang="en_US">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights" lang="en_US">MIT theses are protected by copyright. They may be viewed, downloaded, or printed from this source but further reproduction or distribution in any format is prohibited without written permission.</dim:field>
   <dim:field mdschema="dc" element="rights" qualifier="uri" lang="en_US">http://dspace.mit.edu/handle/1721.1/7582</dim:field>
   <dim:field mdschema="dc" element="subject" lang="en_US">Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="title" lang="en_US">Large-area CVD growth of two-dimensional transition metal dichalcogenides and monolayer MoS₂ and WS₂ metal-oxide-semiconductor field-effect transistors</dim:field>
   <dim:field mdschema="dc" element="title" qualifier="alternative" lang="en_US">Large-area chemical vapor deposition growth of two-dimensional transition metal dichalcogenides and monolayer MoS₂ and WS₂ metal-oxide-semiconductor field-effect transistors</dim:field>
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   	&lt;Title>Large-area CVD growth of two-dimensional transition metal dichalcogenides and monolayer MoS₂ and WS₂ metal-oxide-semiconductor field-effect transistors&lt;/Title>
   	&lt;Subtitle>Large-area chemical vapor deposition growth of two-dimensional transition metal dichalcogenides and monolayer MoS₂ and WS₂ metal-oxide-semiconductor field-effect transistors&lt;/Subtitle>
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   	&lt;PublicationDate>2017&lt;/PublicationDate>
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        	&lt;DisplayName>Shen, Pin-Chun&lt;/DisplayName>
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    &lt;Keyword>Electrical Engineering and Computer Science.&lt;/Keyword>
   	&lt;Abstract>Two-dimensional semiconducting materials such as MoS₂ and WS₂ have been attractive for use in ultra-scaled electronic and optoelectronic devices because of their atomically-thin thickness, direct band gap, and lack of dangling bonds. Methods for large-area growth of 2D semiconducting materials are needed to bring them to practical applications. This thesis aims to develop reliable methods for growing high-quality monolayer MoS₂ and WS₂ by CVD and explore their intrinsic electrical transport properties for electronic and optoelectronic device applications. The as-grown monolayer MoS₂ and WS₂ exhibit n-type semiconducting behavior with excellent optical properties. Various techniques are employed to characterize the CVD-grown materials, including photoluminescence, UV-visible absorption, Raman spectroscopy, X-ray photoelectron spectroscopy, and atomic force microscopy. Moreover, the electronic transport characteristics of single-layer CVD-grown MoS₂ and WS₂ field-effect transistors with a back-gated configuration are demonstrated.&lt;/Abstract>
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